Siglent

siglent-blog

Resolver simulation with an arbitrary waveform generator

A resolver is an electromagnetic sensor that determines the angle and speed of shafts and axes

siglent-blog

EasyScope X - Average Waveform Data

Averaging the signal curve can be a useful way to reduce the noise in a particular signal.

siglent-blog

Improved TDR measurements with the SNA5000A

TDR is crucial for cable quality in high-speed transmissions due to impedance and signal-to-noise ratio.

siglent-blog

Test open socket communication with PuTTY

In test instrumentation, an open socket is a fixed address for remote commands on the Ethernet/LAN bus.

siglent-blog

RF noise figure measurements Spectrum analyzer SVA1032X

The noise figure is crucial in microwave production and measurement

siglent-blog

Checking a LAN connection using Telnet

Automated testing increases productivity, accuracy and throughput through computer control and software utilisation

siglent-blog

DIY spectrum analyser input protection

SIGLENT spectrum analysers for broadcast signals, transmitter troubleshooting, interference and RF devices.

siglent-blog

Jitter spectrum measurements with a digital oscilloscope

Random jitter can have less objectionable audible effects than jitter that is dominated by a specific frequency.

siglent-blog

Comparison Siglent SDS1104X-E vs. SDS1104X-U Oscilloscopes

Overview of the differences between the Siglent SDS1104X-E and SDS1104X-U models.

siglent-blog

Oscilloscope Remote control TEK emulation mode

This application note describes the features and use of the Tektronix compatibility mode for remote control of the SIGLENT SDS5000X and SDS6000A series oscilloscopes.

siglent-blog

Signent oscilloscope option table

Overview of options for the SDS2000X-E / Plus, SDS5000X & SDS6000A series.

siglent-blog

Synchronisation of multiple function generators

Multi-channel function generators are versatile and important in radar tests and for simulating current distortion

siglent-blog

Datalogging with four-channel SDS1000X-E oscilloscopes

Many test and measurement applications require data collection over a long period of time.