Testing the inductance and DC resistance (DCR) of induction cooktops
An induction cooktop uses the principle of electromagnetic induction to generate heat. An alternating current passing through the coil creates a continuously changing magnetic field.
Eddy currents are generated within the conductor in this alternating magnetic field. These are caused by the movement of charge carriers in the conductor, which are driven by the eddy field. The Joule effect of the eddy currents increases the temperature of the conductor, thus enabling heating.
The high-frequency current generated for induction cooktops is typically based on components such as capacitors, inductors, IGBTs (Insulated Gate Bipolar Transistors) , and other components. The properties of these components directly determine the functionality of the induction cooktop.
Tonghui's component testing system meets the required measurement requirements for testing these components.
Solution details
Object being measured:
Induction hob
Measurement requirements:
Test conditions:
- Frequency: 100 kHz
- Test level: 1 V
Measured values:
- Inductance (Ls): 82 μH
- DC resistance (DCR): 62 mΩ
Temperature compensation function
The customer integrates a PT500 temperature sensor into the TH2829AX and combines it with a customer-specific program to implement a temperature compensation function.
This allows the inductance value and the temperature-compensated DCR value to be measured simultaneously, and the data to be transmitted.
This solution effectively reduces the number of testing stations and improves testing efficiency.