The TH512 C-V analyser (1 kHz-2 MHz) for measuring Ciss, Coss, Crss, Rg has a measuring range of 0 - 1500V Vds.
Volume discounts on request!
€18,399.00 Net
€21,894.81 incl. VAT
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Währung
Delivery time: 1-2 weeks
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- 2 year guarantee
Description
The TH511 is a high-precision semiconductor C-V characteristic analyser that reliably determines the input capacitance Ciss, output capacitance Coss, feedback capacitance Crss and gate resistance Rg in the wide frequency range from 1 kHz to 2 MHz.With an adjustable gate bias of ±40 V and a drain bias of 200 V (TH511), 1,500 V (TH512) or 3,000 V (TH513), the device also allows on-off and contact tests, list and trace scans as well as modular test sequences for individual transistors and IGBT modules on up to six channels.
Numerous automation interfaces (USB, LAN, GPIB) and protocol options (SCPI/Modbus) ensure seamless integration into test environments and production lines.
Features
- VDS: 0 - 1500V
- 10.1-inch capacitive touchscreen, resolution 1280 x 800, Linux system
- Dual CPU architecture, highest test speed of the LCR function: 0.56 ms
- Three test methods: random test, list scan and graphic scan (optional)
- Four parasitic parameters (Ciss, Coss, Crss, Rg) are measured and displayed on the same screen
- CV curve scan, Ciss-Rg curve scan
- Integrated design: LCR + VGS low voltage source + VDS high voltage source + channel switching + PC
- Standard 2-channel test that can test two devices or dual-chip devices simultaneously. The number of channels can be extended to 6, the channel parameters are stored separately.
- Fast charging shortens capacitor charging time and enables fast tests.
- Automatic delay setting
- High bias voltage: VGS: 0 - ±40 V
- Sorting with 10 containers
Applications
- Semiconductor components/power components
Testing the parasitic capacitance and analysing the C-V characteristic of diodes, triodes, MOSFETs, IGBTs, thyristors, integrated circuits, optoelectronic chips, etc. - Semiconductor material
Wafer, analysis of the C-V characteristic curve - Liquid crystal material
Analysis of elastic constants - Capacitive elements
Testing and analysing the C-V characteristic of capacitors, testing and analysing capacitive sensors
Technical Data
| Parameters |  TH511 | TH512 | TH513 |
|---|---|---|---|
| Drain bias (vds) | 0 - 200 V | 0 - 1500 V | 0 - 3000 V |
| Channels | 2 (expandable to 4/6) | 2 (expandable to 4/6) | 2 (expandable to 4/6) |
| Display | 10.1″ capacitive touchscreen | 10.1″ capacitive touchscreen | 10.1″ capacitive touchscreen |
| Aspect ratio | 0,6729 | 0,6729 | 0,6729 |
| Resolution (display) | 1280 × RGB × 800 | 1280 × RGB × 800 | 1280 × RGB × 800 |
| Test parameters | Ciss, Coss, Crss, Rg - any four can be selected | Ciss, Coss, Crss, Rg - any four can be selected | Ciss, Coss, Crss, Rg - any four selectable |
| Measuring frequency range | 1 kHz - 2 MHz | 1 kHz - 2 MHz | 1 kHz - 2 MHz |
| Frequency accuracy | 0,0001 % | 0,0001 % | 0,0001 % |
| Frequency resolution | 10 mHz: 1.00000 - 9.99999 kHz 100 mHz: 10.0000 - 99.9999 kHz 1 Hz: 100.000 - 999.999 kHz 10 Hz: 1.00000 - 2.00000 MHz | 10 mHz: 1.00000 - 9.99999 kHz 100 mHz: 10.0000 - 99.9999 kHz 1 Hz: 100.000 - 999.999 kHz 10 Hz: 1.00000 - 2.00000 MHz | 10 mHz: 1.00000 - 9.99999 kHz 100 mHz: 10.0000 - 99.9999 kHz 1 Hz: 100.000 - 999.999 kHz 10 Hz: 1.00000 - 2.00000 MHz |
| Test level range | 5 mVrms - 2 Vrms | 5 mVrms - 2 Vrms | 5 mVrms - 2 Vrms |
| Level accuracy | ± (10 % × input value + 2 mV) | ± (10 % × input value + 2 mV) | ± (10 % × input value + 2 mV) |
| Level resolution | 1 mVrms (5 mVrms-1 Vrms) 10 mVrms (1 Vrms-2 Vrms) | 1 mVrms (5 mVrms-1 Vrms) 10 mVrms (1 Vrms-2 Vrms) | 1 mVrms (5 mVrms-1 Vrms) 10 mVrms (1 Vrms-2 Vrms) |
| Gate bias (vgs) | 0 - ± 40 V | 0 - ± 40 V | 0 - ± 40 V |
| Gate accuracy | ± (1 % × vgs + 8 mV) | ± (1 % × vgs + 8 mV) | ± (1 % × vgs + 8 mV) |
| Gate resolution | 1 mV (0 - ± 10 V) 10 mV (± 10 - ± 40 V) | 1 mV (0 - ± 10 V) 10 mV (± 10 - ± 40 V) | 1 mV (0 - ± 10 V) 10 mV (± 10 - ± 40 V) |
| Output impedance | 100 Ω ± 2 % @ 1 kHz | 100 Ω ± 2 % @ 1 kHz | 100 Ω ± 2 % @ 1 kHz |
| Calculation functions | Absolute deviation Δ, percentage deviation Δ % | Absolute deviation Δ, percentage deviation Δ % | Absolute deviation Δ, percentage deviation Δ % |
| Calibration functions | OPEN, SHORT, LOAD | OPEN, SHORT, LOAD | OPEN, SHORT, LOAD |
| Averaging | 1 - 255 measurement cycles | 1 - 255 measurement runs | 1 - 255 measurement passes |
| AD conversion time | Fast+: 0.56 ms (> 5 kHz) Fast: 3.3 ms Medium: 90 ms Slow: 220 ms | Fast+: 0.56 ms (> 5 kHz) Fast: 3.3 ms Average: 90 ms Slow: 220 ms | Fast+: 0.56 ms (> 5 kHz) Fast: 3.3 ms Average: 90 ms Slow: 220 ms |
| Basic accuracy | 0,001 % | 0,001 % | 0,001 % |
| Measuring range Ciss/Coss/Crss | 0.00001 pF - 9.99999 F | 0.00001 pF - 9.99999 F | 0.00001 pF - 9.99999 F |
| Measuring range Rg | 0.001 mΩ - 99.9999 MΩ | 0.001 mΩ - 99.9999 MΩ | 0.001 mΩ - 99.9999 MΩ |
| Δ % range | ± (0,000 % - 999,9 %) | ± (0,000 % - 999,9 %) | ± (0,000 % - 999,9 %) |
| List scan - points | 20 points (average value per point adjustable, sorting possible) | 20 points (average value per point can be set, sorting possible) | 20 points (average value per point can be set, sorting possible) |
| Parameters (list scan) | Test frequency, vgs, vds, channel | Test frequency, vgs, vds, channel | Test frequency, vgs, vds, channel |
| Trigger mode (Seq.) | All points per trigger; /EOM/INDEX once | All points per trigger; /EOM/INDEX once | All points per trigger; /EOM/INDEX once |
| Trigger mode (step) | One point per trigger; /EOM/INDEX per point; Comparator only on the last point | One point per trigger; /EOM/INDEX per point; comparator only on the last point | One point per trigger; /EOM/INDEX per point; comparator only on the last point |
| Graphical scan - points | Up to 1001 points freely selectable | Up to 1001 points freely selectable | Up to 1001 points freely selectable |
| Result display (graphic) | Multiple curves with the same parameter ↔ different vgs Multiple curves with the same vgs ↔ different parameters | Multiple curves with the same parameter ↔ different vgs Multiple curves with the same vgs ↔ different parameters | Multiple curves with the same parameter ↔ different vgs Multiple curves with the same vgs ↔ different parameters |
| Display area (graphic) | Real-time automatic, locked | Real-time automatic, locked | Real-time automatic, locked |
| Coordinate ruler | Logarithmic, linear | Logarithmic, linear | Logarithmic, linear |
| Parameters (graphic) | vgs, vds | vgs, vds | vgs, vds |
| Trigger (graphic, single) | Single manual trigger: complete scan | Single manual trigger: complete scan | Single manual trigger: complete scan |
| Trigger (graphic, cont.) | Endless loop: Start → End | Endless loop: Start → End | Endless loop: Start → End |
| Saving results | Graphic, files | Graphic, files | Graphic, files |
| Comparator (bins) | 10 bins, PASS, FAIL | 10 bins, PASS, FAIL | 10 bins, PASS, FAIL |
| Bin deviation | Deviation, percentage deviation, Off | Deviation, percentage deviation, Off | Deviation, percentage deviation, Off |
| Bin mode | Tolerance, continuous | Tolerance, continuous | Tolerance, continuous |
| Bin counting | 0 - 99 999 | 0 - 99 999 | 0 - 99 999 |
| Bin judgement | Max. 4 parameter limits/bin; exceeding → bin number; otherwise FAIL | Max. 4 parameter limits/bin; exceeding → bin number; otherwise FAIL | Max. 4 parameter limits/bin; exceeding → bin number; otherwise FAIL |
| PASS/FAIL display | Bin 1 - 10 → PASS LED; otherwise FAIL LED | Bin 1 - 10 → PASS LED; otherwise FAIL LED | Bin 1 - 10 → PASS LED; otherwise FAIL LED |
| Data storage | 201 Measurement results can be read in the stack | 201 Measurement results readable in stack | 201 Measurement results readable in stack |
| Internal memory | ~ 100 MB Flash for configuration files | ~ 100 MB Flash for configuration files | ~ 100 MB Flash for configuration files |
| External memory (USB) | Configurations, screenshots, logs | Configurations, screenshots, logs | Configurations, screenshots, logs |
| Keyboard lock | Lockable front panel buttons | Lockable front panel buttons | Lockable front panel buttons |
| USB HOST | 2× USB HOST (mouse/keyboard), 1× USB stick | 2× USB HOST (mouse/keyboard), 1× USB stick | 2× USB HOST (mouse/keyboard), 1× USB stick |
| USB DEVICE | USB type B, USB TMC-USB488, USB 2.0 | USB type B, USB TMC-USB488, USB 2.0 | USB type B, USB TMC-USB488, USB 2.0 |
| LAN | 10/100 Mbit/s Ethernet | 10/100 Mbit/s Ethernet | 10/100 Mbit/s Ethernet |
| HANDLER | Bin signal output | Bin signal output | Bin signal output |
| RS232C | 9-pin, crossed | 9-pin, crossed | 9-pin, crossed |
| RS485 | Optional via RS232→RS485 module | Optional via RS232→RS485 module | Optional via RS232→RS485 module |
| Heat-up time | ≥ 60 minutes | ≥ 60 minutes | ≥ 60 minutes |
| Mains voltage | 100 - 120 VAC / 198 - 242 VAC, 47 - 63 Hz | 100 - 120 VAC / 198 - 242 VAC, 47 - 63 Hz | 100 - 120 VAC / 198 - 242 VAC, 47 - 63 Hz |
| Power consumption | ≥ 130 VA | ≥ 130 VA | ≥ 130 VA |
| Dimensions (W×H×D) | 430 × 177 × 405 mm | 430 × 177 × 405 mm | 430 × 177 × 405 mm |
| Weight | 12 kg | 12 kg | 12 kg |
