Dual-channel SMU with ±210 V / 3.03 A, 6½-digit display, 10 fA / 100 nV resolution and 100,000 measuring points/s. For precise semiconductor and power tests.
Volume discounts on request!
€8,280.00 Net
€9,853.20 incl. VAT
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Delivery time: 5 to 6 weeks
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Model
Description
The SMM3312X source measurement unit from Siglent is a two-channel, high-precision SMU for research, development and testing tasks. It offers ±210 V, ±3.03 A and 31.8 W output power per channel, a resolution of 100 nV / 10 fA and a 6½-digit display. With up to 100,000 measuring points/s, pulse operation up to ±10.5 A (min. pulse width 50 µs) and DC, pulse, scan and list operating modes, it fulfils demanding I-V and power tests. The integrated 5-inch TFT display visualises measurement data numerically and graphically, while LAN and USB enable remote control and data exchange.
Features
- Dual-channel source-measure unit (2 channels)
- Max. Output ±210 V, ±3.03 A, 31.8 W per channel
- Pulse operation up to ±10.5 A, minimum pulse width 50 µs
- Programme/measurement resolution 100 nV / 10 fA
- 6½-digit display (2,100,000 counts) on 5\" TFT
- Measuring rate up to 100,000 points/s
- Operating modes: DC, pulse, scan, list
- Accuracies: Voltage 0.015% + 225 µV, Current 0.1% + 100 pA (readback)
- Interfaces: USB host/device and LAN; optional USB-GPIB adapter
The SMM3312X is a two-channel SMU platform designed for precise characterisation of semiconductors, power semiconductors and material samples. With ±210 V, ±3.03 A and 31.8 W per channel as well as pulse capabilities up to ±10.5 A and a minimum pulse width of 50 µs, fast transient and switching loss measurements can be reliably mapped. The combination of 100 nV / 10 fA resolution, 6½-digit display and a measurement rate of up to 100,000 points/s enables fine-grained I-V curves and detailed data sets. Sequences can be automated via SCPI or the integrated user interface; the list mode allows steps from 10 µs. Graph and roll views support the direct evaluation of large data sets on the 5-inch TFT. Typical applications include characteristic curve measurements, component characterisation under pulse conditions and automated test specimens in laboratory and production environments. USB and LAN interfaces simplify integration into measuring stands and automated processes, while an optional adapter further expands communication.
