TH2829CX - Automatic transformer test system, 7″ TFT-LCD, 20 PIN, 20 Hz-1 MHz, 5 mVrms-2 Vrms, DC bias ±10 V/100 mA, 75 measurements/s, optional LCR function.
Volume discounts on request!
€3,789.00 Net
€4,508.91 incl. VAT
Shipping country
Customer Group
Währung
Delivery time: 1-2 weeks
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- 2 year guarantee
Description
The Tonghui TH2829X series is a high-precision automatic transformer test system with an integrated LCR module that enables both single and multi-channel scans. Equipped with a 7″ TFT LCD (800×480), DC bias source (0-±10 V/0-±100 mA) and high measurement speed of up to 75 times/s, it covers a wide frequency range up to 1 MHz and is ideal for manufacturing and R&D thanks to Linux OS, bar code function, pass/fail comparator and statistical analysis.Features
- 7″ TFT LCD with 800 × 480 pixels
- Frequency range up to 1 MHz, resolution 0.5 mHz
- Signal level 5 mV-2 Vrms (optional 2 Vrms-10 Vrms)
- DC bias voltage source 0-±10 V/0-±100 mA, optional current source 0-±1 A/±2 A
- Measuring speed up to 75 times/s (≈ 13 ms/90 ms/370 ms)
- Diode forward/reverse test (0-9.9999 V / 0-99.999 mA)
- Comparator with 10 bin, pass/fail indication & file count function
- Statistical analysis (Cpk, Cp, Ck) & bar code reader for setup files
- Online upgrade via USB HOST or RS232, LAN network capability
- Backwards compatibility to TH2818X/TH2819X setup files
Applications
- Scanning tests of switching and mains transformers with comprehensive characterisation
- Multi-channel tests of passive components (L, R, C)
- DCR scans and contact resistance measurements in soldering and assemblies
- Pass/fail sorting with handler interface for automated production
- Impedance network analyses of multiple components in series/parallel
Technical Data
| Model |  TH2829AX | TH2829CX |
|---|---|---|
| Display | 7″ TFT-LCD, 800×480 px | 7″ TFT-LCD, 800×480 px |
| Test pins | 20 PIN | 20 PIN |
| Frequency range | 20 Hz - 200 kHz | 20 Hz - 1 MHz |
| LCR function | Optional | Optional |
| Transformer test parameters | Turn Ratio, Turns, Phase, L, C, Lk, Q, ACR, DCR, Balance, Pin Short, Diode, P/N | |
| LCR test parameters | |Z|, |Y|, C, L, X, B, R, G, D, Q, θ, DCR, turn ratio, phase, Lk | |
| Basic accuracy | LCRZ 0.05 %; DCR/turn ratio 0.1 % | |
| Signal source impedance | 10 Ω, 30 Ω, 50 Ω, 100 Ω | |
| Measuring speed | 13 ms / 90 ms / 370 ms | |
| AC signal level | 5 mVrms-2 Vrms (Xfmr), 5 mVrms-10 Vrms (LCR); 50 µArms-100 mArms | |
| DC bias voltage | 0 - ±10 V; 0 - ±100 mA | |
| DC bias current | 0 - ±1 A (TH2901); 0 - ±2 A (TH2902) | |
| DC constant current | 0 - ±120 mA (diode test) | |
| Diode test | 0 - 9.9999 V / 0 - 99.999 mA | |
| Comparator | 10 bins, pass/fail, file counting | |
| Memory | Internal: 100 setup; USB: 500 setup, CSV data, GIF images | |
| Dimensions (W×H×D) | 400×132×385 mm | |
| Weight (W×H×D) | 13 kg | |