Micsig CP1503B AC/DC Current Probe

Features

• DC to 150 MHz bandwidth: The highest bandwidth in the CP series' low-current family.
• ≤2.67 ns rise time: For fast current edges and transients.
• Two current ranges: 5 A range (1 V/1 A, 1X) and 30 A range (1 V/10 A, 10X).
• 30 Arms / 50 Apk maximum input: Continuous input up to 30 Arms, with peaks up to 50 Apk.
• 1 mA resolution: Minimum measurable current of 1 mA in the 5 A range.
• ±1% DC accuracy: For reliable DC and static current readings.
• Low noise floor: ≤400 μArms in the 5 A range and ≤120 μArms in the 30 A range.
• 5 mm jaw opening: Clamps around small conductors.
• Degauss/auto-zero and over-current alarm: One-touch zeroing and a warning when the input exceeds the range.
• Standard BNC output: Micsig states compatibility with oscilloscopes of all brands.

Why to Choose

• Resolve fast wide-bandgap switching: 150 MHz bandwidth and ≤2.67 ns rise time capture the fast current edges typical of GaN and SiC designs.
• See small currents clearly: 1 mA resolution and a low noise floor make weak signals, such as gate-drive currents, visible on the scope.
• Fast transients and static current in one probe: The same probe shows switching transients and the steady gate-drive current, because it measures from DC upwards.
• No shunt in the current path: The clamp-on design measures without inserting a resistor into the circuit.
• Works with the scope you already have: The BNC output connects directly to standard oscilloscope inputs.
• Pairs with the CP5005 for a complete current chain: Together with the 500 A CP5005 and a Micsig high-resolution oscilloscope, you cover currents from 1 mA to 500 Arms.

Best suited for

• Gate-drive current analysis: Capture fast gate-drive current transients at 150 MHz bandwidth. The 1 mA resolution also covers static gate-drive current.
• SiC and GaN double-pulse testing: Observe gate-drive current with the CP1503B while a CP5005 measures device current. With a voltage probe and a Micsig MHO6 series 12-bit oscilloscope, voltage and current are captured together for switching-loss evaluation.
• Switching power supplies: Measure inrush current and high-frequency ripple current during SMPS development.
• Consumer electronics R&D: Observe inrush and high-frequency ripple current during product development. Add a CP5005 when power-stage currents exceed the CP1503B range.